Tester Parameter | RT66C |
Voltage Range (built-in drive voltage) | ±200V |
Voltage Range with an external amplifier and high voltage interface (HVI) | 10KV |
Number of ADC Bits | 14 |
Minimum Charge Resolution | 122fC |
Minimum Area Resolution (assuming 1 ADC bit = 1μC/cm2) | 12.2μ2 |
Maximum Charge Resolution | 4.8μC |
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) | 4.8mm2 |
Maximum Charge Resolution with High Voltage Interface (HVI) | 480μC |
Maximum Area Resolution (assuming saturation polarization = 100μC/cm2) w/o HVI | >4.8cm2 |
Maximum Hysteresis Frequency | 1KHz |
Minimum Hysteresis Frequency | 1/8th Hz |
Minimum Pulse Width | 500μs |
Minimum Pulse Rise Time (5V) | 500μs |
Maximum Pulse Width | 100ms |
Maximum Delay between Pulses | 40ks |
Internal Clock | 50μs |
Minimum Leakage Current (assuming max current integration period = 1 seconds) | 10pA |
Maximum Small Signal Cap Frequency | 2KHz |
Minimum Small Signal Cap Frequency | 10Hz |
Output Rise Time Control | 2 settings |
Input Capacitance | 1pF |
Electrometer Input All Test Frequencies for all test at any speed | Yes |
* The minimum area resolution under actual test conditions depends upon the internal noise environment of the tester, the external noise environment, and the test jig parasitic capacitance. | |
*** Tester specifications are subject to change without notice. |