HALL EFFECT MEASUREMENT SYSTEM:
A Powerful Tool for Semiconductor Device Characterization


The HCS Hall Effect Measurement System from Linseis is a powerful tool for semiconductor device characterization. It can measure a variety of electric transport properties, including Hall mobility, charge carrier concentration, resistivity, Hall constant, and Seebeck coefficient. This information can be used to improve device performance, reduce development costs, and enhance reliability.

Applications
  • Semiconductor device characterization
  • Measurement of electric transport properties
  • Determination of Hall mobility, charge carrier concentration, resistivity, Hall constant, and Seebeck coefficient

Compliance with National and International Standards
Our instruments operate according to national and international standards such as ASTM F76 - 08 (Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors).

Available in: Malaysia
Manufacturer's website : https://www.linseis.com/en/



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Hall Effect Analyzer Products


HCS Hall Effect Measurement System:
A Comprehensive Solution for Semiconductor Device Characterization

The Linseis HCS Hall Effect Measurement System, comes with three magnet options which allows the characterization/analysis of semiconductor devices. The instrument measures electric transport properties such as mobility, resistivity, charge carrier concentration and Hall constant.

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