The LINSEIS Thin Film Analyzer is special designed measurement system for characterization of a wide range of physical properties of thin film samples (nm to µm range). The instrument is easy to use and fast in measuring performance, and delivering highly accurate results.

The Thin Film Analyzer instrument is modular and can be configured to perform the measurement of the following properties: Basic device:
• λ – Thermal Conductivity
• cp – Specific Heat
• ε – Emissivity (depends on sample properties)

Thermoelectric package:
• ρ – Electrical Resistivity / σ – Electrical Conductivity
• S – Seebeck Coefficient

Magnetic package:
• AH – Hall Constant
• μ – Mobility (calculation depending on model)
• n – Charge carrier concentration (calculation depending on model)

Available in: Malaysia
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Thin Film Analyzer Products

Thin Film Analyzer TFA

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