Thin Film Laser Flash TF-LFA

Based on the established Laser Flash technique, the Linseis Thin Film Laserflash (TF-LFA) is a unique instrument which allows the analysis of thermophysical properties (thermal conductivity/diffusivity) of thin films from 80nm up to 20 μm thickness.

Three methods are possible:

1. High Speed Laserflash Method (Rear heating Front detection (RF))

The measurement geometry is similar compared to the standard Laserflash equipment setup with detector and laser are on opposite sides of the samples. Due to the IR-detectors normally used are too slow for measurement for thin layers of thin film samples, the detection is carried out by the so called thermoreflectance method.

2. Time Domain Thermoreflectance Method (Front heating Front detection (FF))

The measurement geometry is called “front heating front detection (FF)” because detector and laser are on the same side of the sample. This method can be applied to thin layers on non-transparent substrates for which the RF technique is not suitable.

3. Combined High Speed Laserflash (RF) and Time Domain Thermoreflectance Method (FF)

Combination of both method in a single system for getting the advantages from both method

SPECIFICATIONS

THIN FILM ANALYZER

Sample dimensions	Round with a diameter of 10mm to 20mm
Thin film samples	80nm up to 40µm (depends on sample)
Temperature range	RT, RT up to 500°C or -100 to 500°C
Heating and cooling rates	0.01 up to 10°C/min
Vacuum	0.01 up to 10°C/min
Atmosphere	inert, oxidizing or reducing
Thermal Diffusivity Measuring range	0,01mm²/s up to 1000mm²/s
Pumplaser	Nd:YAG Laser (1064 nm), maximum pulse current: 90mJ/pulse (software controled), Pulse width: 5 ns (optional 1ns) spot size 1-4 mm with adjustable lens (smaller spot size on request)
Probe-Laser	DPSS CW Laser (473 nm, 50 mW)
Photoreceiver	Si-PIN-Photodiode, active diameter: 0.8mm, bandwidth DC … 400MHz, risetime: 1ns