3D OPTICAL PROFILOMETERS IN MALAYSIA: PRECISION SURFACE METROLOGY SOLUTIONS
As the authorized distributor for Rtec Instruments in Malaysia, LMS Scientific Solution Sdn Bhd is proud to bring the industry’s most advanced, non-contact 3D surface profiling technologies directly to local research centers, universities, and industrial quality control (QC) laboratories.
Whether your facility is managing advanced failure analysis, optimizing protective coatings, or conducting precision materials characterization in electronics, automotive, or aerospace engineering, the Rtec UP Series delivers the accurate, quantitative data your team requires.
Whether your facility is managing advanced failure analysis, optimizing protective coatings, or conducting precision materials characterization in electronics, automotive, or aerospace engineering, the Rtec UP Series delivers the accurate, quantitative data your team requires.
Why Choose Rtec Instruments 3D Optical Profilers?
Traditional 2D optical microscopy leaves gaps in quantitative depth and surface finish evaluation. Rtec Instruments’ revolutionary universal surface profiling platform overcomes these limitations by combining multiple advanced optical imaging techniques onto a single head. With sub-nanometer vertical resolution and high-speed multi-pixel color imaging, you can instantly measure and analyze surface roughness, step height, texture, geometry, and film thickness across virtually any material.
Key Performance Advantages:
- Industry-Leading Speed: Equipped with high-resolution cameras operating at up to 200–250 FPS+ for lightning-fast area scanning and flawless image stitching.
- Uncompromising Z-Axis Resolution: State-of-the-art encoders provide the highest vertical resolution on the market, completely independent of your scanning distance or magnification.
- Multi-Mode Versatility: Seamlessly switch between spinning disk confocal microscopy, white light interferometry (WLI), dark field, bright field, and variable focus imaging at the click of a single button.
- ISO-Compliant Automation: Generate automatic, quantitative test reports with built-in pass/fail criteria analysis, minimizing operator error in high-throughput QC environments.
Comprehensive Analysis for Every Industry
The Rtec UP Series features an open frame design and customizable high-precision cross-roller XY stages to accommodate diverse sample types:
- Semiconductors & Electronics: Full wafer inspection (up to 300×300 mm), wafer bumps, pellicles, and microfluidic channel tracking.
- Advanced Coatings & Thin Films: Real-time thickness determination, scratch testing characterization, and multi-layer reflection mapping.
- Automotive & Precision Manufacturing: Detailed wear track analysis, volume loss calculations, indentation, and roughness verification compliant with international ISO standards.
Manufacturer’s website:
https://rtec-instruments.com/
3D Optical Profilometers Product
The ultimate 6-in-1 modular flagship platform. Integrates Spinning Disk Confocal, White Light Interferometry (WLI), Variable Focus, Dark Field, and optional premium modules like Atomic Force Microscopy (AFM), Raman Spectroscopy, and Spectral Film Thickness. Perfect for large samples up to 300x300mm.
The general-purpose industry workhorse. Combines 5 core imaging modes (Confocal, Interferometer, Dark Field, Bright Field, and Variable Focus) into an advanced, compact head equipped with dual dedicated high-speed cameras to optimize individual optical paths.
A highly focused, cost-effective, and fully automated solution specializing in White Light Interferometry (WLI). It provides elite sub-nanometer Z-axis resolution ideal for profiling surface roughness, flat step-heights, and topography on smooth, reflective, or highly textured samples.