Rtec UP-2000 3D Optical Profilometer: High-Precision White Light Interferometry
LMS Scientific Solution Sdn Bhd is proud to offer the Rtec UP-2000 3D Universal Optical Profilometer to laboratories, universities, and industrial facilities across Malaysia. Serving as the dedicated, highly focused solution within the Rtec UP Series, the UP-2000 is engineered specifically to deliver elite non-contact surface topography measurements on a cost-effective and streamlined platform.
Built with a high-precision cross-roller XY stage and a versatile 150 x 200 x 150 mm stage configuration, the UP-2000 is optimized for targeted surface analysis. It provides a fully automated workflow that specializes in White Light Interferometry (WLI) and Variable Focus imaging, making elite, sub-nanometer vertical resolution highly accessible for budget-conscious research and high-throughput production environments alike.
Built with a high-precision cross-roller XY stage and a versatile 150 x 200 x 150 mm stage configuration, the UP-2000 is optimized for targeted surface analysis. It provides a fully automated workflow that specializes in White Light Interferometry (WLI) and Variable Focus imaging, making elite, sub-nanometer vertical resolution highly accessible for budget-conscious research and high-throughput production environments alike.
Focused Multi-Mode Optical Capabilities
The UP-2000 simplifies precision metrology by providing advanced, non-contact surface profiling from the nano to the micro scale. With an automated, user-friendly platform, operators can seamlessly switch between specialized imaging techniques to capture quantitative topography data without any manual sample movement:
- White Light Interferometry (WLI): The premier optical technique for smooth, flat, or highly reflective surfaces. By recombining light reflected from an internal reference mirror and the sample surface, it generates perfect 2D and 3D height models. WLI delivers an industry-leading sub-nanometer Z-axis resolution that remains completely uncompromised by your choice of objective magnification.
- Variable Focus Imaging: Engineered for rapid shape and topography tracking over larger surface profiles. This mode quickly builds perfectly sharp, unifocus 3D images of complex geometries and rough textures at rapid scanning speeds.
- Automatic Image Stitching: Combined with Rtec’s next-generation high-speed cameras, the UP-2000 offers automated image stitching that runs across an unlimited range in X and Y, enabling wide-area mapping at maximum magnification.
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SPECIFICATIONS
BROCHURE
SPECIFICATIONS
| XYZ Stage Travel Range | 150 x 200 x 150mm (High-precision cross-roller XY stage) |
| Z-Axis Encoder | Advanced high-resolution encoder with 150-mm travel |
| Core Profiling Modes | White Light Interferometry (WLI), Variable Focus Imaging |
| Interferometry Vertical Resolution | Better than 0.01 nm |
| Interferometry RMS Repeatability | 0.01 nm |
| WLI Light Sources | User-selectable 4-color LED (White, Red-630nm, Green-530nm, Blue-460nm) |
| Scanning Speed Capabilities | High-speed cameras running 250 FPS+ for rapid area coverage |
BROCHURE
| 3D Optical Profilometers UP Series-2026-B-01A |  Free Download PDF >> |
3D OPTICAL PROFILMETERS
3D OPTICAL PROFILMETERS